Ionizing Radiation Effects in Mos Devices and Circuits (Hardcover) (ISBN-13: 9780471848936)

This is the first comprehensive overview describing the effects of ionizing radiation on MOS devices, and how to design, fabricate, and test integrated circuits intended for use in a radiation environment. It also addresses process-induced radiation effects in the fabrication of high-density circuits, and reviews the history of radiation-hard technology, providing background information for those new to the field. The book includes a comprehensive review of the literature, and an annotated listing of research activities in radiation-hardness research. The volume will be of benefit to semi conductor process development engineers, device and circuit development engineers, device physicists, reliability assurance engineers, project managers and stress analysts.

Author: T. P. Ma
ISBN-10: 047184893X
ISBN-13: 9780471848936
Publisher: Wiley-Interscience
Language: English
Published: 04/18/1989
Pages: 608
Format: Hardcover
Weight: 2.09lbs
Size: 9.62h x 6.58w x 1.35d