Key Concepts of Scanning Electron Microscopy (Hardcover) (ISBN-13: 9781632383068)

This book on scanning electron microscopy examines the key concepts employed in the field. Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. This book focuses on various issues concerned with scanning electron microscopy, covering both theoretical and practical applications. It further includes numerous topics on geoscience, instrumentation, mineralogy, thin films, biology, ceramic and materials for electronic industry. This book includes contributions by renowned researchers and experts in this field.

Author: Lisa Page
ISBN-10: 1632383063
ISBN-13: 9781632383068
Publisher: NY Research Press
Language: English
Published: 01/16/2015
Pages: 256
Format: Hardcover
Weight: 1.13lbs
Size: 9.00h x 6.00w x 0.63d