Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications by Rein, Stefan

Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications (Hardcover) (ISBN-13: 9783540253037)

Vendor: Stefan Rein
Product type: Books
Format: Hardcover
$329.99
$329.99
$329.99
Subtotal: $329.99
Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications by Rein, Stefan

Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications

$329.99
Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications by Rein, Stefan

Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications

$329.99
Format: Hardcover
Description
Description
x

Author: Stefan Rein
ISBN-10: 3540253033
ISBN-13: 9783540253037
Publisher: Springer
Language: English
Published: 06/23/2005
Pages: 492
Format: Hardcover
Weight: 1.85lbs
Size: 9.10h x 6.20w x 1.30d
By Stefan Rein
By Stefan Rein
x

10/99 "Gustav-Mie-Preis" awarded for the diploma thesis by the Faculty of Physics at Albert-Ludwigs-University Freiburg

09/99 - 05/04 PhD thesis in physics at Fraunhofer ISE and University of Konstanz:
"Lifetime spectroscopy as a method of defect characterization in silicon for photovoltaic applications" (overall grade: summa cum laude)

08/95 - 01/97 Undergraduate assistant at Fraunhofer ISE in the area of solar cell
characterization

12/98 - 08/99 Research assistant at Fraunhofer ISE
1. in the department of solar cells - materials - technology
2. in the department of thermal optical systems

06/04 - today Research assistant at Fraunhofer ISE

Recently Viewed Products