Micro- And Nanoelectronics: Emerging Device Challenges and Solutions by Brozek, Tomasz

Micro- And Nanoelectronics: Emerging Device Challenges and Solutions (Hardcover) (ISBN-13: 9781482214901)

Vendor: Tomasz Brozek
Product type: Books
Format: Hardcover
$270.00
$270.00
$270.00
Subtotal: $270.00
Micro- And Nanoelectronics: Emerging Device Challenges and Solutions by Brozek, Tomasz

Micro- And Nanoelectronics: Emerging Device Challenges and Solutions

$270.00
Micro- And Nanoelectronics: Emerging Device Challenges and Solutions by Brozek, Tomasz

Micro- And Nanoelectronics: Emerging Device Challenges and Solutions

$270.00
Format: Hardcover
Description
Description
x

Micro- and Nanoelectronics: Emerging Device Challenges and Solutions presents a comprehensive overview of the current state of the art of micro- and nanoelectronics, covering the field from fundamental science and material properties to novel ways of making nanodevices. Containing contributions from experts in both industry and academia, this cutting-edge text:

  • Discusses emerging silicon devices for CMOS technologies, fully depleted device architectures, characteristics, and scaling
  • Explains the specifics of silicon compound devices (SiGe, SiC) and their unique properties
  • Explores various options for post-CMOS nanoelectronics, such as spintronic devices and nanoionic switches
  • Describes the latest developments in carbon nanotubes, iii-v devices structures, and more

Micro- and Nanoelectronics: Emerging Device Challenges and Solutions provides an excellent representation of a complex engineering field, examining emerging materials and device architecture alternatives with the potential to shape the future of nanotechnology.



Author: Tomasz Brozek
ISBN-10: 1482214903
ISBN-13: 9781482214901
Publisher: CRC Press
Language: English
Published: 11/04/2014
Pages: 392
Format: Hardcover
Weight: 1.55lbs
Size: 9.20h x 6.20w x 1.10d
By Tomasz Brozek
By Tomasz Brozek
x

Tomasz Brozek is a technical fellow at PDF Solutions, San Jose, California, USA, where he is responsible for advanced silicon technology characterization, diagnostic methods development, and early yield ramp of integrated circuits. He holds an MS EE and a Ph.D in physics. His doctorate research at the Institute of Semiconductor Physics in Kiev, Ukraine focused on radiation effects and degradation in microelectronic MOS systems. Previously he taught and conducted research at Warsaw University of Technology, Poland and the University of California, Los Angeles, USA, and worked at Motorola R&D organizations in Texas and Arizona, USA.

Recently Viewed Products