Microelectronic Reliability: Integrity Assessment and Assurance (Hardcover) (ISBN-13: 9780890063507)

A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi

Author: Emiliano Pollino
ISBN-10: 0890063508
ISBN-13: 9780890063507
Publisher: Artech House Publishers
Language: English
Published: 04/01/1989
Pages: 556
Format: Hardcover
Weight: 2.40lbs
Size: 9.26h x 6.32w x 1.60d