Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK by Cullis, A. G.

Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK (Paperback) (ISBN-13: 9783642068706)

Vendor: A. G. Cullis
Product type: Books
Format: Paperback
$219.99
$219.99
$219.99
Subtotal: $219.99
Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK by Cullis, A. G.

Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

$219.99
Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK by Cullis, A. G.

Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

$219.99
Format: Paperback
Description
Description
x

The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction.



Author: A. G. Cullis
ISBN-10: 3642068707
ISBN-13: 9783642068706
Publisher: Springer
Language: English
Published: 10/19/2010
Pages: 540
Format: Paperback
Weight: 1.70lbs
Size: 9.21h x 6.14w x 1.13d

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