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MOS Interface Physics, Process and Characterization (Paperback) (ISBN-13: 9781032106281)
Vendor:
Shengkai Wang
Product type:
Books
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Description
xThe electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.
Author: Shengkai Wang,Xiaolei Wang
ISBN-10: 103210628X
ISBN-13: 9781032106281
Publisher: CRC Press
Language: English
Published: 01/29/2024
Pages: 162
Format: Paperback
Weight: 0.53lbs
Size: 9.00h x 6.00w x 0.37d
By Shengkai Wang
xShengkai Wang is a professor in the Institute of Microelectronics, Chinese Academy of Sciences. He received Ph.D. from the University of Tokyo in 2011 and has been engaged in Ge, III-V, SiC in MOS technology. He has published more than 100 papers and authorized 40+ patents.
Xiaolei Wang is a professor in the Institute of Microelectronics, Chinese Academy of Sciences. He received Ph.D. from the Institute of Microelectronics, Chinese Academy of Sciences in 2013 and has been engaged in Si/Ge based MOS technology. He has published more than 100 papers.
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