On-Line Testing for VLSI (Paperback) (ISBN-13: 9781441950338)

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.
On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties.
On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

Author: Michael Nicolaidis
ISBN-10: 1441950338
ISBN-13: 9781441950338
Publisher: Springer
Language: English
Published: 12/06/2010
Pages: 160
Format: Paperback
Weight: 0.85lbs
Size: 11.00h x 8.25w x 0.35d