On-Wafer Microwave Measurements and de-Embedding (Hardcover) (ISBN-13: 9781630810566)

This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies.

Author: Errikos Lourandakis
ISBN-10: 1630810568
ISBN-13: 9781630810566
Publisher: Artech House Publishers
Language: English
Published: 07/31/2016
Pages: 280
Format: Hardcover
Weight: 1.20lbs
Size: 9.30h x 6.20w x 0.80d