Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability by Dumin, David J.

Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability (Hardcover) (ISBN-13: 9789810248420)

Vendor: David J. Dumin
Product type: Books
Format: Hardcover
$129.00
$129.00
$129.00
Subtotal: $129.00
Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability by Dumin, David J.

Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability

$129.00
Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability by Dumin, David J.

Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability

$129.00
Format: Hardcover
Description
Description
x
This book presents in summary the state of our knowledge of oxide reliability. The articles have been written by experts who are among the most knowledgeable in the field. The book will be an invaluable aid to reliability engineers and manufacturing engineers, helping them to produce and characterize reliable oxides. It can be used as an introduction for new engineers interested in oxide reliability, besides being a reference for engineers already engaged in the field.

Author: David J. Dumin
ISBN-10: 9810248423
ISBN-13: 9789810248420
Publisher: World Scientific Publishing Company
Language: English
Published: 01/28/2002
Pages: 280
Format: Hardcover
Weight: 1.38lbs
Size: 10.08h x 6.70w x 0.77d

Recently Viewed Products