Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices by Schrimpf, Ronald D.

Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices (Hardcover) (ISBN-13: 9789812389404)

Vendor: Ronald D. Schrimpf
Product type: Books
Format: Hardcover
$162.00
$162.00
$162.00
Subtotal: $162.00
Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices by Schrimpf, Ronald D.

Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices

$162.00
Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices by Schrimpf, Ronald D.

Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices

$162.00
Format: Hardcover
Description
Description
x
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

Author: Ronald D. Schrimpf
ISBN-10: 9812389407
ISBN-13: 9789812389404
Publisher: World Scientific Publishing Company
Language: English
Published: 08/03/2004
Pages: 348
Format: Hardcover
Weight: 1.50lbs
Size: 9.80h x 6.60w x 0.90d

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