Radiation Status of Sub-65 NM Electronics by Pellish, Jonathan a.

Radiation Status of Sub-65 NM Electronics (Paperback) (ISBN-13: 9781289013929)

Vendor: Jonathan a. Pellish
Product type: Books
Format: Paperback
$15.75
$15.75
$15.75
Subtotal: $15.75
Radiation Status of Sub-65 NM Electronics by Pellish, Jonathan a.

Radiation Status of Sub-65 NM Electronics

$15.75
Radiation Status of Sub-65 NM Electronics by Pellish, Jonathan a.

Radiation Status of Sub-65 NM Electronics

$15.75
Format: Paperback
Description
Description
x
Ultra-scaled complementary metal oxide semiconductor (CMOS) includes commercial foundry capabilities at and below the 65 nm technology node Radiation evaluations take place using standard products and test characterization vehicles (memories, logic/latch chains, etc.) NEPP focus is two-fold: (1) Conduct early radiation evaluations to ascertain viability for future NASA missions (i.e. leverage commercial technology development). (2) Uncover gaps in current testing methodologies and mechanism comprehension -- early risk mitigation.

Author: Jonathan a. Pellish
ISBN-10: 1289013926
ISBN-13: 9781289013929
Publisher: Bibliogov
Language: English
Published: 06/26/2013
Pages: 28
Format: Paperback
Weight: 0.15lbs
Size: 9.69h x 7.44w x 0.06d

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