Random Non-Random Periodic Fau (Hardcover) (ISBN-13: 9782881249259)

This book provides a comprehensive overview of stacking faults in crystal structures. Subjects covered include: notations used in representations of close-packed structures; types of faults; methods of detection and measurement such as X-ray diffraction, electron diffraction and other techniques; theoretical models of non-random faulting during phase transitions; specific examples of - close packed structures including, zinc sulphide, silicon carbide and silver iodide.

Author: M. T. Sebastian,P. Krishna
ISBN-10: 2881249256
ISBN-13: 9782881249259
Publisher: Routledge
Language: English
Published: 03/31/1994
Pages: 400
Format: Hardcover