Reliability and Degradation of III-V Optical Devices (Hardcover) (ISBN-13: 9780890066522)

Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems, and describing methods for elimination of defect-generating mechanisms.

Author: Osamu Ueda
ISBN-10: 0890066523
ISBN-13: 9780890066522
Publisher: Artech House Publishers
Language: English
Published: 09/30/1996
Pages: 372
Format: Hardcover
Weight: 1.43lbs
Size: 9.30h x 6.31w x 0.95d