Reliability Of Power Gallium Nitride Based Transistors (Paperback) (ISBN-13: 9781021177858)

In this cutting-edge study, Denis Marcon examines the reliability of power gallium nitride (GaN) based transistors. Using advanced simulation techniques and experimental data, he develops new models for predicting the reliability of these devices under various operating conditions. This book will be of particular interest to researchers and engineers working on power electronics and related fields.

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