Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Paperback) (ISBN-13: 9783642083723)

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

Author: P. W. Hawkes, Ludwig Reimer
ISBN-10: 3642083722
ISBN-13: 9783642083723
Publisher: Springer
Language: English
Published: 12/01/2010
Pages: 529
Format: Paperback
Weight: 1.70lbs
Size: 9.00h x 6.10w x 1.10d