Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy (Paperback) (ISBN-13: 9783662505571)

Introduction.- Harmonic Oscillator.- Technical Aspects of Scanning Probe Microscopy.- Scanning Probe Microscopy Designs.- Electronics for Scanning Probe Microscopy.- Lock-In Technique.- Data Representation and Image Processing.- Artifacts in SPM.- Work Function, Contact Potential, and Kelvin Probe Scanning Force Microscopy.- Surface States.- Forces Between Tip and Sample.- Technical Aspects of Atomic force Microscopy (AFM).- Static Atomic Force Microscopy.- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy.- Intermittent Contact Mode/Tapping Mode.- Mapping of Mechanical Properties Using Force-Distance Curves.- Frequency Modulation (FM) Mode in Dynamic Atomic Force Microscopy.- Noise in Atomic Force Microscopy.- Quartz Sensors in Atomic force Microscopy.- Scanning Tunneling Microscopy.- Scanning Tunneling Spectroscopy (STS).- Vibrational Spectroscopy with the STM.- Spectroscopy and Imaging of Surface States.- Building Nanostructures Atom by Atom.

Author: Bert Voigtl舅der
ISBN-10: 3662505576
ISBN-13: 9783662505571
Publisher: Springer
Language: English
Published: 10/13/2016
Pages: 382
Format: Paperback
Weight: 1.23lbs
Size: 9.21h x 6.14w x 0.82d