Scanning Probe Microscopy (Hardcover) (ISBN-13: 9781632384072)

Scanning Probe Microscopy (SPM) involves forming images of surfaces using a physical scanning and detection method. The key subject of this text, scanning probe microscopy is a major tool for the progress of nanotechnology with functions in a multitude of study spheres. This book comprises of unique studies on the uses of SPM methods for the classification of physical attributes of various materials at the nano level. The various topics covered in this book vary from morphology of surfaces to analyzing thin films. The diversity of topics covered in this book reflects the prominent interdisciplinary trait of the study in the sphere of scanning probe microscopy.

Author: Kate Wright
ISBN-10: 1632384078
ISBN-13: 9781632384072
Publisher: NY Research Press
Language: English
Published: 01/12/2015
Pages: 256
Format: Hardcover
Weight: 1.13lbs
Size: 9.00h x 6.00w x 0.63d