Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging and Analysis (Hardcover) (ISBN-13: 9781848167896)

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.

Author: Nobuo Tanaka
ISBN-10: 184816789X
ISBN-13: 9781848167896
Publisher: Imperial College Press
Language: English
Published: 06/06/2014
Pages: 616
Format: Hardcover
Weight: 2.29lbs
Size: 9.00h x 6.10w x 1.30d