Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization by Stevie, Fred

Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization (Paperback) (ISBN-13: 9781606505885)

Vendor: Fred Stevie
Product type: Books
Format: Paperback
$79.95
$79.95
$79.95
Subtotal: $79.95
Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization by Stevie, Fred

Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization

$79.95
Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization by Stevie, Fred

Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization

$79.95
Format: Paperback
Description
Description
x
This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.

Author: Fred Stevie
ISBN-10: 1606505882
ISBN-13: 9781606505885
Publisher: Momentum Press
Language: English
Published: 09/15/2015
Pages: 277
Format: Paperback
Weight: 0.86lbs
Size: 9.00h x 6.00w x 0.61d
By Fred Stevie
By Fred Stevie
x
Senior Researcher, North Carolina State University

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