Strain Effect in Semiconductors: Theory and Device Applications (Hardcover) (ISBN-13: 9781441905512)

Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. Discusses relevant applications of strain while also focusing on the fundamental physics pertaining to bulk, planar, and scaled nano-devices. Hence, this book is relevant for current strained Si logic technology as well as for understanding the physics and scaling for future strained nano-scale devices.

Author: Yongke Sun, Scott E. Thompson, Toshikazu Nishida
ISBN-10: 1441905510
ISBN-13: 9781441905512
Publisher: Springer
Language: English
Published: 12/04/2009
Pages: 350
Format: Hardcover
Weight: 1.51lbs
Size: 9.21h x 6.14w x 0.81d