Study of Recrystallization via Electrical Resistivity Measurements (Paperback) (ISBN-13: 9783639182392)

Recrystallization has been extensively utilized for variety of materials to modify the microstructure and achieving desired mechanical properties. Therefore, characterization of recrystallization is an important aspect. However, most of the existing characterization techniques are either not in-situ in nature or too complex. In the present work, a novel method of spline-based isogeometric approximation and robust numerical differentiation has been originated and employed to the in-situ resistivity data to characterize recrystallization. It has been shown that this method is able to reveal the elusive effects of recrystallization from the in-situ electrical resistivity measurements. An extensive experimental work on Al-Mg and Al-Mg-Fe-Mn alloys, which are extensively used in automotive industry, showed that this method is sensitive, reliable, accurate and efficient. An extensive literature on the recrystallization and related phenomena, resistivity measurements and cubic splines has also been provided in the book. This work should be useful to the people involved in research and development activities, especially characterization of materials, in industry as well as academia.

Author: Sanjay Vajpai
ISBN-10: 3639182391
ISBN-13: 9783639182392
Publisher: VDM Verlag
Language: English
Published: 07/31/2009
Pages: 98
Format: Paperback
Weight: 0.34lbs
Size: 9.00h x 6.00w x 0.23d