Surface and Interface Analysis: Principles and Applications by Kim, Seong H.

Surface and Interface Analysis: Principles and Applications (Paperback) (ISBN-13: 9781394218349)

Vendor: Seong H. Kim
Product type: Books
Format: Paperback
$129.25
$129.25
$129.25
Subtotal: $129.25
Surface and Interface Analysis: Principles and Applications by Kim, Seong H.

Surface and Interface Analysis: Principles and Applications

$129.25
Surface and Interface Analysis: Principles and Applications by Kim, Seong H.

Surface and Interface Analysis: Principles and Applications

$129.25
Format: Paperback
Description
Description
x

Comprehensive textbook covering characterization techniques to understand the chemistry and structure of materials on surfaces and at interfaces

Surface and Interface Analysis is a comprehensive textbook resource that covers everything readers need to know about surface energy, molecular speciation, and optical and physical characterization techniques. Assuming only basic knowledge of general chemistry (electronic orbitals, organic functional groups), physics (electromagnetic waves, Maxwell equations), physical chemistry (Schr?dinger equation, harmonic oscillator), and mathematics (wave equations, covariance matrix), this textbook helps readers understand the underlying principles of the discussed characterization techniques and enables them to translate theoretical knowledge into applied skills through a Maieutic pedagogical approach.

Written by a highly qualified professor, Surface and Interface Analysis: Fundamental Principles includes information on:

  • Relationship between surface energy and the Gibbs free energy equation and surface characterization techniques that work in an ultra-high vacuum
  • Measurement of binding energy of photoelectrons and relaxation processes that can occur upon or during the photoelectron emission process
  • Governance of energy level of the valence band and what can be learned from analyzing the valence band with XPS
  • Improvement of depth resolution in sputter profiling and artifacts that may be encountered during sputter depth profiling

Surface and Interface Analysis is an ideal textbook resource on the subject for graduate students in the fields of solid state physics, optics, materials science, chemistry, and engineering who want to learn and apply advanced materials characterization methods, along with undergraduate students in advanced elective courses.

Author: Seong H. Kim
ISBN-10: 1394218346
ISBN-13: 9781394218349
Publisher: Wiley
Language: English
Published: 01/09/2025
Pages: 416
Format: Paperback

By Seong H. Kim
By Seong H. Kim
x

Seong H. Kim, PhD, is Distinguished Professor at the Department of Chemical Engineering of The Pennsylvania State University, USA. He is also affiliated with the Department of Materials Science and Engineering and the Department of Chemistry. He received his BS and MS degrees from Yonsei University, South Korea, and his PhD from Northwestern University, USA. He then worked as a postdoctoral researcher at the University of California, Berkeley, USA, before joining the faculty of chemical engineering at Penn State.

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