Theoretical and Practical Advances in Computer-Based Educational Measurement (Hardcover) (ISBN-13: 9783030184797)

Cor Sluijter is director of the department of psychometrics and research of Cito. He has over 30 years of experience in developing paper- and computer-based tests and other assessment instruments for both the private and public sector. Cor was responsible for the transition of Cito's Student Monitoring System for primary education from paper based to computer based. He was also responsible for the development of compulsory computerized (adaptive) entrance tests for the Teacher Colleges for Primary Education in the Netherlands and for the introduction of computerized exams for Dutch and arithmetic's in Middle Vocational Education. Cor is a former Chair of the Dutch Exams Association (NVE) and member of the Dutch Advisory Board on Competencies in Financial Services. He is also co-editor of the Journal of Applied Testing Technology of the association of Test Publishers. Since 2014 Cor is a Fellow of the Association for Educational Assessment Europe. He holds a PhD in Social andBehavioural Sciences from the University of Amsterdam.

Bernard Veldkamp is full professor and head of the Department of Research Methodology, Measurement, and Data Analysis. He is chair of the Technology, Data-analytics and Decision-support Systems (DDS) Cluster of the faculty of Behavioral Management and Social Sciences at University of Twente. He is specialized in research methodology and data analytics and more specifically in the development of new methods/models for the design and construction of (adaptive) psychological and educational tests and learning environments. He works on the development of datamining models for analysing verbal data and large datasets. Bernard was founder and scientific director of the Research Centre for Examination and Certification (RCEC), a cooperation between CITO and University of Twente. He spent a year at Law School Admission Council in Newtown, Pennsylvania, where he worked on robustness of test assembly methods and on the combination of datamining and IRT models to increase measurement precision.