Thin-Film Transistor Reliability (Paperback) (ISBN-13: 9789815322637)

Thin-Film Transistor Reliability provides a comprehensive analysis of the reliability challenges in thin-film transistors (TFTs), essential components in modern electronics. Covering topics from fundamental structures to degradation mechanisms, this book equips researchers and engineers with the tools to assess, analyze, and improve TFT reliability.

The book systematically explores key reliability concerns, including performance characterization, defect states, voltage stress effects, circuit-level degradation, and environmental influences. Advanced reliability analysis methods and practical improvement strategies are also discussed, offering insights into future developments.

Key Features:
- In-depth discussion of TFT degradation mechanisms and reliability concerns.
- Comprehensive analysis techniques, including transfer curve and noise analysis.
- Effects of DC/AC voltage stress, self-heating, and environmental factors.
- Strategies for enhancing TFT reliability through structural modifications.

Author: Mingxiang Wang,Meng Zhang
ISBN-10: 981532263X
ISBN-13: 9789815322637
Publisher: Bentham Science Publishers
Language: English
Published: 04/18/2025
Pages: 354
Format: Paperback
Weight: 1.88lbs
Size: 10.00h x 7.00w x 0.92d