Three-Dimensional Positron Annihilation Momentum Measurement Technique Applied To Measure Oxygen-Atom Defects in 6H Silicon Carbide by Williams, Christopher S.

Three-Dimensional Positron Annihilation Momentum Measurement Technique Applied To Measure Oxygen-Atom Defects in 6H Silicon Carbide (Paperback) (ISBN-13: 9781288398669)

Product type: Books
Format: Paperback
$18.95
$18.95
$18.95
Subtotal: $18.95
Three-Dimensional Positron Annihilation Momentum Measurement Technique Applied To Measure Oxygen-Atom Defects in 6H Silicon Carbide by Williams, Christopher S.

Three-Dimensional Positron Annihilation Momentum Measurement Technique Applied To Measure Oxygen-Atom Defects in 6H Silicon Carbide

$18.95

Three-Dimensional Positron Annihilation Momentum Measurement Technique Applied To Measure Oxygen-Atom Defects in 6H Silicon Carbide

$18.95
Format: Paperback

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