VLSI Implementation of Built in Self-Test (Paperback) (ISBN-13: 9786207807802)

Built-in Self-Test (BIST) is a technique that integrates additional hardware and software into integrated circuits, enabling them to perform self-testing. A key component often used in BIST is the Linear Feedback Shift Register (LFSR), a shift register where the input bit is a linear function of its previous state.BIST is the standard method for testing embedded memories. Over time, memory BIST techniques have evolved to address the growing demands of advanced technologies and markets. BIST improves testing efficiency by allowing full-speed memory access and reducing manufacturing test time through rapid, on-chip pattern generation.This book focuses on implementing BIST using Verilog HDL on Xilinx ISE 14.7. It includes the design of an LFSR and an SRAM controller to support BIST, enhancing overall system performance.

Author: M. Fatima,Shubham Sahu
ISBN-10: 6207807804
ISBN-13: 9786207807802
Publisher: LAP Lambert Academic Publishing
Language: English
Published: 07/29/2025
Pages: 64
Format: Paperback
Weight: 0.22lbs
Size: 9.00h x 6.00w x 0.15d