VLSI Test Principles and Architectures: Design for Testability by Wang, Laung-Terng

VLSI Test Principles and Architectures: Design for Testability (Hardcover) (ISBN-13: 9780123705976)

Vendor: Laung-Terng Wang
Product type: Books
Format: Hardcover
$89.95
$89.95
$89.95
Subtotal: $89.95
VLSI Test Principles and Architectures: Design for Testability by Wang, Laung-Terng

VLSI Test Principles and Architectures: Design for Testability

$89.95
VLSI Test Principles and Architectures: Design for Testability by Wang, Laung-Terng

VLSI Test Principles and Architectures: Design for Testability

$89.95
Format: Hardcover
Description
Description
x
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

Author: Laung-Terng Wang,Cheng-Wen Wu,Xiaoqing Wen
ISBN-10: 0123705975
ISBN-13: 9780123705976
Publisher: Morgan Kaufmann Publishers
Language: English
Published: 06/01/2006
Pages: 808
Format: Hardcover
Weight: 3.92lbs
Size: 9.38h x 8.12w x 2.06d

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