VLSI Test Principles and Architectures: Design for Testability (Paperback) (ISBN-13: 9781493300860)

Vendor: Laung-Terng Wang
Product type: Books
Format: Paperback
$89.95
$89.95
$89.95
Subtotal: $89.95
WR Book House

VLSI Test Principles and Architectures: Design for Testability

$89.95

VLSI Test Principles and Architectures: Design for Testability

$89.95
Format: Paperback
Description
Description
x
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
. Most up-to-date coverage of design for testability.
. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
. Lecture slides and exercise solutions for all chapters are now available.
. Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website."

Author: Laung-Terng Wang,Cheng-Wen Wu,Xiaoqing Wen
ISBN-10: 1493300865
ISBN-13: 9781493300860
Publisher: Morgan Kaufmann Publishers
Language: English
Published: 07/21/2006
Pages: 808
Format: Paperback

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