X-Ray Line Profile Analysis in Materials Science (Hardcover) (ISBN-13: 9781466658523)

X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.

Author: Jenő Gubicza
ISBN-10: 1466658525
ISBN-13: 9781466658523
Publisher: Engineering Science Reference
Language: English
Published: 03/31/2014
Pages: 359
Format: Hardcover
Weight: 1.85lbs
Size: 10.00h x 7.00w x 0.81d