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X-Ray Structure Analysis (Paperback) (ISBN-13: 9783110610703)
Vendor:
Theo Siegrist
Product type:
Books
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Description
xThis book offers a compact overview on crystallography, symmetry, and applications of symmetry concepts. The author explains the theory behind scattering and diffraction of electromagnetic radiation. X-ray diffraction on single crystals as well as quantitative evaluation of powder patterns are discussed.
Author: Theo Siegrist
ISBN-10: 3110610701
ISBN-13: 9783110610703
Publisher: de Gruyter
Language: English
Published: 11/22/2021
Pages: 250
Format: Paperback
Weight: 0.89lbs
Size: 9.61h x 6.69w x 0.53d
By Theo Siegrist
xThis book offers a compact overview on crystallography, symmetry, and applications of symmetry concepts. The author explains the theory behind scattering and diffraction of electromagnetic radiation. X-ray diffraction on single crystals as well as quantitative evaluation of powder patterns are discussed. The book also introduces applications of group theory and tensor properties of crystals. This is the ideal primer for students and graduates to understand the essentials of cristallography.
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