Yield and Reliability in Microwave Circuit and System Design (Hardcover) (ISBN-13: 9780890065273)

This reference is for anyone involved with microwave design. It tackles the practical aspects of microwave statistical design and introduces statistical design techniques that encompass many different applications. This presentation focuses on two main example areas - microwave circuits and systems - but any application with a complex relation between design variables and performance and design variable uncertainty can benefit from statistical design.

Author: Michael D. Meehan
ISBN-10: 0890065276
ISBN-13: 9780890065273
Publisher: Artech House Publishers
Language: English
Published: 12/01/1993
Pages: 300
Format: Hardcover
Weight: 1.29lbs
Size: 9.34h x 6.25w x 0.84d