ieee

The 25 papers cover delay testing and test scheduling, scan and functional testing, system testing, quiescent current testing, analog and mixed-signal testing, core-based testing, fault simulation and field programmable gate array testing, challenges in deep sub-micron testing, high level tests, memAuthor: IEEEISBN-10: 0769507018ISBN-13: 9780769507019Publisher:...

A collection of papers from the International Conference on Parallel Architectures and Compilation Techniques (PACT 2000). It addresses: register allocation and analysis; architectural design; optimizations and opportunities; high performance memory techniques; branch prediction; and more.Author: IEEEISBN-10: 0769506224ISBN-13: 9780769506227Publisher: Institute of Electrical & Electronics EngineeLanguage:...